Semiconductor dynamic characteristic testing machine - メーカー・企業と業務用製品 | イプロスものづくり

Semiconductor dynamic characteristic testing machineの製品一覧

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Dynamic Tester『ST-6527B』

Multiple different measurement item conditions can be set, allowing for continuous testing.

The ST-6527B is a device that measures the dynamic characteristics of semiconductors according to set test conditions. All test items are analyzed by capturing waveforms with a digital oscilloscope for measurement and judgment. It is equipped with a variety of analysis functions, including single tests, sweep tests, and loop tests. Additionally, L load, R load, snubber capacitors, diodes, and gate resistors use a plug-in type, allowing for various hardware configurations. 【Features】 - Easy management of measurement data and waveform data - Specialized for dynamic characteristic testing of power devices - Capable of testing at high temperatures (up to 230°C) *For more details, please download the PDF or feel free to contact us.

企業：嶺光音電機
価格：Other

Other measurement, recording and measuring instruments
Semiconductor inspection/test equipment
Semiconductor dynamic characteristic testing machine

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Dynamic Tester『ST-2400』

It is a device that measures the dynamic characteristics of semiconductors according to specified test conditions.

The "ST-2400" is a device designed for safely and efficiently conducting research and development, reliability testing, and destructive testing as a dynamic tester for power devices. It allows for the setting of up to 10 waveform analysis conditions with a single pulse application, enabling a reduction in evaluation time. The program for conducting tests requires only the input of necessary parameters for the condition items, making it easy to operate. Additionally, test results are saved in measurement data (CSV format) and waveform data (CSV format and JPG format), allowing for the creation of graphs and tables using commercial software (such as Excel). 【Features】 ■ Easy management of measurement data and waveform data ■ Top-class dynamic characteristic testing for power devices ■ Suitable for shortening product development time for power devices *For more details, please download the PDF or feel free to contact us.